| 沈自才,牟永强,吴宜勇.电子辐照Kapton/Al薄膜力学性能退化规律与机理研究[J].装备环境工程,2015,12(3):42-44,69. SHEN Zi-cai,MU Yong-qiang,WU Yi-yong.Study on thethe Mechanical Property Degradation Pattern and Mechanism of the Mechanical Property of Kapton/Al Film by Electron Radiation[J].Equipment Environmental Engineering,2015,12(3):42-44,69. |
| 电子辐照Kapton/Al薄膜力学性能退化规律与机理研究 |
| Study on thethe Mechanical Property Degradation Pattern and Mechanism of the Mechanical Property of Kapton/Al Film by Electron Radiation |
| 投稿时间：2015-01-15 修订日期：2015-06-15 |
| DOI：10.7643/issn.1672-9242.2015.03.007 |
| 中文关键词: 薄膜材料 力学性能 电子辐照 |
| 英文关键词:thin film material mechanical property electron radiation |
| 基金项目:国家自然科学基金资助项目 （41174166， 51273052） |
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| 中文摘要: |
| 目的 为航天器用Kapton/Al薄膜材料的选用提供数据支撑和高性能Kapton/Al薄膜材料的研制提供理论支持。方法 用综合辐照试验装置对Kapton/Al薄膜材料进行电子辐照， 用拉力试验机对Kapton/Al薄膜材料开展力学性能拉伸试验， 用XPS对其成分和微观结构进行测试分析。结果 Kapton/Al薄膜材料的抗拉强度和断裂伸长率随着拉伸速度的增加而降低， 随着电子辐照注量的增加呈指数减小， 在电子辐照下， 薄膜材料分子键发生断裂和交联， C—CO和C—N键断裂发生脱氧和脱氮反应， C—H基团相对含量增大。结论 电子辐照将造成Kapton/Al薄膜材料力学性能降低， 薄膜材料分子价健的断裂和交联是薄膜力学性能降低的主要原因。 |
| 英文摘要: |
| Objective To provide data support for selection of Kapton/Al film used in spacecraft and theortheoretical supporty for preparation of high performance Kapton/Al material. Methods The Kapton/Al film was radiated by electron from the combined space radiation environment simulator, and tested by the tensile testing machine, and its component and microstructure was analyzed by XPS. Results The tensile strength and the rupture elongation of the Kapton/Al film decreaseds with the increase of tensile ratio and electron dosage. The rupture and cross linkage of molecular bonds in the film, the deoxidation of C—CO, the denitrification of C—N and the increase of C—H percentage are were caused induced by electron radiation. Conclusion Electron radiation on of Kapton/Al film results in the decrease of its mechanical property of it, and the rupture and cross linkage of molecular bonds are is the main cause of its property degradation. |
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