| 李坤兰,青 林.某型混合集成电路长期贮存寿命研究[J].装备环境工程,2016,13(6):110-113. 李坤兰,青 林.Study on Long-term storage lifetime of a HIC[J].Equipment Environmental Engineering,2016,13(6):110-113. |
| 某型混合集成电路长期贮存寿命研究 |
| Study on Long-term storage lifetime of a HIC |
| 投稿时间：2016-04-13 修订日期：2016-11-11 |
| DOI：10.7643/ issn.1672-9242.2016.06.019 |
| 中文关键词: 混合集成电路 贮存试验 性能参数 贮存寿命 预测 |
| 英文关键词:HIC storage test function parameters storage lifetime prediction |
| 基金项目: |
|
|
|
|
| 摘要点击次数: |
| 全文下载次数: |
| 中文摘要: |
| 选用某型混合集成电路在A(寒温)、B(亚湿热)、C(亚湿热)、D(热带海洋)等4地开展了为期172个月的库房贮存试验,跟踪测试了其性能参数增益。本文应用灰色预测理论中的灰色GM(1,1)模型,对该型混合集成电路的贮存寿命进行了预测,结果表明D地的寿命最长,为32年；A地的寿命最短,为21年。进一步分析表明,增益的退化与高温无关,而温度较差会加速其退化。就该型混合集成电路而言,B地和C地的环境应力对其影响无明显差异。 |
| 英文摘要: |
| Storage test of a HIC was carried out in warehouse at 4 places, A(cold climate), B(subtropical climate), C(subtropical climate) and D(tropical maritime climate) for a period of 120 months. Their functional parameters were tested. It’s storage lifetime was predicted by GM(1,1) model. The result shows that the storage lifetime of D is the longest and the storage lifetime of A is the shortest. The storage lifetime of A is 21 years. The storage lifetime of D is 32 years. The degradation of Gain has nothing to do with high temperature. The temperature range speeds up degradation of Gain. In terms of this HIC, the effect of environmental stress of B and C is little different. |
| 查看全文 查看/发表评论 下载PDF阅读器 |
| 关闭 |
