| 左毅,樊志强,曹江,徐珞.基于数智孪生的装备全周期敏捷试验技术[J].装备环境工程,2021,18(4):57-63. ZUO Yi,FAN Zhi-qiang,CAO Jiang,XU Luo.Digital-intelligence Twins based Full-cycle Agile Test Technology of Equipment[J].Equipment Environmental Engineering,2021,18(4):57-63. |
| 基于数智孪生的装备全周期敏捷试验技术 |
| Digital-intelligence Twins based Full-cycle Agile Test Technology of Equipment |
| 投稿时间：2021-01-11 修订日期：2021-03-10 |
| DOI：10.7643/issn.1672-9242.2021.04.008 |
| 中文关键词: 数智孪生 全周期敏捷试验 虚拟试验环境中图分类号:TJ01 文献标识码:A 文章编号:1672-9242(2021)04-0057-07 |
| 英文关键词:digital-intelligence twins full cycle agile test virtual test environment |
| 基金项目: |
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| Author | Institution |
| ZUO Yi | The 28th Research Institute of China Electronics Technology Group Corporation, Nanjing 210007, China |
| FAN Zhi-qiang | Academy of Military Sciences PLA China, Beijing 100091, China;North China Institute of Computing Technology, Beijing 100083, China |
| CAO Jiang | Academy of Military Sciences PLA China, Beijing 100091, China |
| XU Luo | North China Institute of Computing Technology, Beijing 100083, China |
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| 中文摘要: |
| 依据数智孪生的基本理论，提出基于数智孪生的装备全周期敏捷试验技术，在数字虚拟空间构建与物理空间孪生相像的虚拟试验环境和装备虚拟孪生体，支持在装备全寿命周期开展试验。从整体上提出基于数智孪生的装备敏捷试验框架、面向全寿命周期的试验开展流程、虚拟试验环境构建与运行机理及试验数据处理与运用技术。通过在数字虚拟空间进行装备全周期的敏捷试验，不但能够有效降低装备试验费用、缩短试验周期，也可避免消耗装备的使用寿命，并能够帮助设计人员事先了解受试装备在试验中的响应特性，及早改进装备设计，对后续要进行的实际物理试验，也能提供一定的指导作用，进而可极大提高试验效率，实现装备的敏捷试验与运用。 |
| 英文摘要: |
| Based on the theory of digital-intelligence twins, a full-cycle agile test technology for equipment is proposed in this paper. Through constructing virtual test environments and equipment virtual twins in the digital virtual space, it can be used to support equipment test throughout its whole life cycle. In the paper, an agile test framework of equipment based on digital intelligence twins, the test process in the whole life cycle of equipment, virtual experiment environment construction and operation mechanism, and experiment data processing and application technology are described. Through the full-cycle agile test of equipment in the digital virtual space, it can not only reduce equipment test costs and shorten the test cycle effectively, but also avoid consuming equipment life length, help designers to understand the equipment characteristics in test in advance and improve the equipment design as early as possible. It can also provide guidance for the actual physical tests to be carried out in the future. Moreover, the test efficiency can be greatly improved, and the agile test and application of equipment can be realized. |
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