| 魏彦江,周祎,杨光,敬小东,官朝晖,雷鸣.星载无源微波器件加速寿命试验方法研究[J].装备环境工程,2021,18(10):45-51. WEI Yan-jiang,ZHOU Yi,YANG Guang,JIN Xiao-dong,GUAN Zhao-hui,LEI Ming.Research on Accelerated Life Test Method of Spaceborne Passive Microwave Devices[J].Equipment Environmental Engineering,2021,18(10):45-51. |
| 星载无源微波器件加速寿命试验方法研究 |
| Research on Accelerated Life Test Method of Spaceborne Passive Microwave Devices |
| 投稿时间：2021-04-22 修订日期：2021-05-20 |
| DOI：10.7643/issn.1672-9242.2021.10.008 |
| 中文关键词: 无源微波器件 双应力 加速寿命试验 高可靠长寿命 广义艾林模型 |
| 英文关键词:passive microwave device dual stress high reliability and long life accelerated life test generalized Eyring model |
| 基金项目: |
|
|
| Author | Institution |
| WEI Yan-jiang | The 29th Research Institute of China Electronics Technology Group Corporation, Chengdu 610036, China |
| ZHOU Yi | The 29th Research Institute of China Electronics Technology Group Corporation, Chengdu 610036, China |
| YANG Guang | The 29th Research Institute of China Electronics Technology Group Corporation, Chengdu 610036, China |
| JIN Xiao-dong | The 29th Research Institute of China Electronics Technology Group Corporation, Chengdu 610036, China |
| GUAN Zhao-hui | The 29th Research Institute of China Electronics Technology Group Corporation, Chengdu 610036, China |
| LEI Ming | The 29th Research Institute of China Electronics Technology Group Corporation, Chengdu 610036, China |
|
| 摘要点击次数: |
| 全文下载次数: |
| 中文摘要: |
| 目的 为星载无源微波器件能够在地面通过加速寿命试验验证其在轨可靠性和寿命提供理论依据和试验方法。方法 设计一种温度和功率同时作用下的双应力加速寿命数学模型，通过分析加速应力与寿命的对应关系，设计科学合理的加速寿命试验方案，通过分析加速寿命试验下器件指标的变化，给出器件可靠性和寿命评估结果。结果 以某隔离器这一典型无源微波器件为例，在选取激活能0.8 eV下，利用温度-功率双应力加速寿命数学模型，计算得隔离器要满足10 a的在轨寿命和可靠性，加速寿命试验时间需不低于1230 h。通过1300 h以上的加速寿命试验，对比试验前后隔离器指标，隔离器的正向损耗恶化了0.07 dB，说明加速寿命试验对产品电性能老化有一定影响，但指标变化均在技术要求范围内，产品能够满足可靠性和寿命要求。结论 设计的温度-功率双应力加速寿命数学模型和加速寿命试验方案，能够为星载无源微波器件高可靠长寿命验证提供参考和借鉴。 |
| 英文摘要: |
| This paper aims to provide theoretical basis and test method for verifying the reliability and life ofpassive microwave devicesof satellites in orbit through accelerated life test on the ground. A mathematical model of double stress accelerated life was designed under the simultaneous action of temperature and power. By analyzing the corresponding relationship between accelerated stress and life, a scientific and reasonable accelerated life test scheme was designed. By analyzing the changes of device index in accelerated life test, the reliability and life evaluation results are given. Taking a typical passive microwave device-isolator as an example, under the selected activation energy of 0.8 eV, using the temperature-power dual stress accelerated life mathematical model, it is calculated that the accelerated life test time needs to be not less than 1230 h for the isolator to meet the 10 a in-orbit life and reliability. Through accelerated life test for more than 1300 hours, comparing the isolator indexes before and after the test, the forward loss of isolator deteriorates by 0.07 dB, indicating that the accelerated life test has certain influence on the electrical performance aging of products, but the index changes are within the technical requirements, indicating that the products can meet the requirements of reliability and life. The designed temperature-power dual stress accelerated life mathematical model and accelerated life test scheme can provide reference for high reliability and long life verification of spaceborne passive microwave devices. |
| 查看全文 查看/发表评论 下载PDF阅读器 |
| 关闭 |
|
|
|
