| 吕瑛,王爱清,闫凯,高素丽.微波功率放大组件加速贮存数据处理及寿命评估[J].装备环境工程,2023,20(10):108-117. LYU Ying,WANG Ai-qing,YAN Kai,GAO Su-li.Accelerated Storage Data Processing and Life Assessment of Microwave Power Amplification Modules[J].Equipment Environmental Engineering,2023,20(10):108-117. |
| 微波功率放大组件加速贮存数据处理及寿命评估 |
| Accelerated Storage Data Processing and Life Assessment of Microwave Power Amplification Modules |
| 投稿时间：2023-08-24 修订日期：2023-10-12 |
| DOI：10.7643/issn.1672-9242.2023.10.013 |
| 中文关键词: 功率放大组件 加速贮存 数据处理 寿命 加速因子 激活能 退化轨迹中图分类号:TJ089 文献标识码:A 文章编号:1672-9242(2023)10-0108-10 |
| 英文关键词:power amplification modules accelerated storage data processing life acceleration factor activation energy degradation trajectory |
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| 中文摘要: |
| 目的 以微波功率放大组件为研究对象，开展加速贮存试验退化数据的处理、建模、分析，给出组件的贮存期评估值和激活能等贮存特征参数。方法 在已完成微波功率放大组件加速贮存试验的基础上，借鉴已有的数据建模及处理方法，开展加速贮存数据处理及寿命评估，应用多种退化轨迹拟合寻优、基于性能退化模型参数折算建模、多种寿命分布建模及拟合优度检验等技术，对贮存数据进行分析处理。结果 给出了微波功率放大组件退化轨迹模型、寿命分布模型、加速因子、激活能等贮存特征参数和可靠寿命评估值。结论 描述的加速贮存试验数据处理方法，适应性好，具有较高的优良性，可为类似具有退化数据的电子设备提供借鉴。 |
| 英文摘要: |
| The work aims to process, model, and analyze degradation data from accelerated storage experiments with microwave power amplification modules as the research object, and provide storage characteristic parameters such as storage life assessment values and activation energy of the modules. Based on the completed accelerated storage test of microwave power amplification modules, existing data modeling and processing methods were adopted to carry out accelerated storage data processing and life assessment. Various degradation trajectory fitting optimization, performance degradation model parameter conversion modeling, multiple life distribution modeling, and goodness of fit testing techniques were applied to analyze and process the storage data. A degradation trajectory model, life distribution model, acceleration factor, activation energy and other storage characteristic parameters of microwave power amplification modules, as well as reliable life assessment values, were provided. The accelerated storage test data processing method proposed has good adaptability and high superiority, and can provide reference for similar electronic devices with degradation data. |
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