| 邓林,连可,黄付刚,李墨,阳昆.航电电源板层间CAF短路失效机理及退化时间分析[J].装备环境工程,2023,20(11):38-44. DENG Lin,LIAN Ke,HUANG Fu-gang,LI Mo,YANG Kun.Analysis on the Failure Mechanism and Degradation Time of CAF between Layers in the PWBs of Avionics Power Supply Module[J].Equipment Environmental Engineering,2023,20(11):38-44. |
| 航电电源板层间CAF短路失效机理及退化时间分析 |
| Analysis on the Failure Mechanism and Degradation Time of CAF between Layers in the PWBs of Avionics Power Supply Module |
| 投稿时间：2023-08-09 修订日期：2023-08-31 |
| DOI：10.7643/issn.1672-9242.2023.11.006 |
| 中文关键词: 阳极导电丝生长(CAF) 失效模式 根本原因分析(RCA) 退化时间中图分类号:TN956 文献标识码:A 文章编号:1672-9242(2023)11-0038-07 |
| 英文关键词:Conductive Anodic Filament Formation (CAF) failure mode root cause analysis (RCA) degradation time |
| 基金项目:企业预研项目(Y225889) |
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| Author | Institution |
| DENG Lin | The 29th Institute of China Electronics Technology Group Corporation, Chengdu 610036, China;Sichuan Provincial Engineering Research Center of High Efficiency Power Converter Technology, Chengdu 610036, China |
| LIAN Ke | Agile Intelligent Computing Sichuan Key Laboratory, Chengdu 610036, China |
| HUANG Fu-gang | The 29th Institute of China Electronics Technology Group Corporation, Chengdu 610036, China;Sichuan Provincial Engineering Research Center of High Efficiency Power Converter Technology, Chengdu 610036, China |
| LI Mo | The 29th Institute of China Electronics Technology Group Corporation, Chengdu 610036, China |
| YANG Kun | Agile Intelligent Computing Sichuan Key Laboratory, Chengdu 610036, China |
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| 摘要点击次数: |
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| 中文摘要: |
| 目的 掌握CAF失效机理MTTF分析方法，以便于在实际案例中实施工程优化决策，从而降低故障危害风险和寿命周期总费用。方法 以某航电电源母板CAF失效为例，基于CAF失效机理的物理化学变化时间特性模型算法，建立电压、介质间距和MTTF变化关系，以辅助工程优化决策。结果 基于仿真计算数据，形成对特定范围产品的改进和处置决策，从而限制失效危害风险的进一步扩散，降低了产品生命周期维护费用，并提升了客户满意度。结论 掌握装备常见失效机理和采取适宜的应对措施，是持续改进装备可用性、可靠性和环境适应性的必要条件。 |
| 英文摘要: |
| The work aims to acquire the MTTF analysis method for the failure mechanism of Conductive Anodic Filament Formation (CAF), so as to facilitate the implementation of engineering optimization decisions in practical cases, thus reducing the risk of failure hazards and the total cost of life cycle. With the failure of CAF in a certain avionics power supply PWB as an example, the relationship among voltage, dielectric spacing and MTTF change was established based on the time characteristic model algorithm of physical and chemical changes of CAF failure mechanism. Based on the simulation calculation data, the improvement and disposal decisions for a specific range of products were formed, thus limiting the further spread of the risk of failure hazards, reducing the maintenance cost of product during life cycle and improving customer satisfaction. It is necessary to master the common failure mechanism of equipment and take appropriate countermeasures to continuously improve the availability, reliability and environmental adaptability of equipment. |
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