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| Study on Accelerated Storage Life Test of Initiating Explosive Device Based on Step Stress Method |
| Received:August 07, 2012 Revised:January 01, 2013 |
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| DOI： |
| KeyWord:initiating explosive device step stress accelerated storage life test constant stress lognormal distribution |
| Author | Institution |
| WANG Ya-hui |
School of Reliability and System Engineering，Beijing University of Aeronautics and Astronautics，Beijing，China |
| LI Xiao-gang |
School of Reliability and System Engineering，Beijing University of Aeronautics and Astronautics，Beijing，China |
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| Abstract: |
| It is very difficult to assess the storage reliability of initiating explosive device under long term storage condition considering its characteristics of long life and high reliability. A step stress accelerated storage life test method to assess the storage reliability of initiating explosive device was put forward, and then converted the data under the step stress accelerated storage life test to the data under the constant stress accelerated storage life test. The storage life of initiating explosive device under the normal stress was analyzed and calculated based on lognormal distribution. |
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