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| Accelerated Storage Life Evaluation of Lithium Niobate Modulators |
| Received:September 24, 2015 Revised:April 15, 2016 |
| View Full Text View/Add Comment Download reader |
| DOI：10.7643/issn.1672-9242.2016.02.027 |
| KeyWord:modulator life evaluation Arrhenius accelerating model activation energy |
| Author | Institution |
| ZHOU Chao-chao |
AVIC Xi′ an Flight Automatic Control Research Institution， Xi′ an ， China |
| WEI Yang |
AVIC Xi′ an Flight Automatic Control Research Institution， Xi′ an ， China |
| HUO Guang |
AVIC Xi′ an Flight Automatic Control Research Institution， Xi′ an ， China |
| SUN Guo-ming |
AVIC Xi′ an Flight Automatic Control Research Institution， Xi′ an ， China |
| XIE Liang-ping |
AVIC Xi′ an Flight Automatic Control Research Institution， Xi′ an ， China |
| LI Xian-luo |
AVIC Xi′ an Flight Automatic Control Research Institution， Xi′ an ， China |
| YAN Ji-zhong |
AVIC Xi′ an Flight Automatic Control Research Institution， Xi′ an ， China |
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| Abstract: |
| Objective To study the evaluation method for accelerated storage Life of FOG. Methods Based on Weibull distribution, employing the accelerated aging life evaluating test theory and technique, this paper proposed a theoretical model for constant stress accelerated aging life evaluation. Then it evaluated the storage reliability and storage life of integration optical modulator under different temperature stress, and analyzed the failure probability of the device in different time periods. Results It was calculated that the M shape parameter of Weibull distribution device was 0.314, which showed that the modulator storage was dominated by early-satge failure. Conclusion By the analysis of failure data of modulator, the Arrhenius accelerating model was determined, and the activation energy was calculated to be 1.1eV. In the environmental condition of 25 ℃, the reliability of 1-year storage of LiNbO3 modulator was 0.9454. |
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