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| Damage Analysis of Lightning Electromagnetic Pulse to Portable Computer Terminal |
| Received:August 02, 2017 Revised:December 15, 2017 |
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| DOI：10.7643/ issn.1672-9242.2017.12.016 |
| KeyWord:lightning electromagnetic pulse, electromagnetic hazard, aperture array, shielding effectiveness, mutual coupling |
| Author | Institution |
| BAO Yong-bo |
Beijing Information Science and Technology University, Beijing , China |
| TIAN Yang-meng |
Beijing Information Science and Technology University, Beijing , China |
| WANG Cai-xia |
Beijing Information Science and Technology University, Beijing , China |
| WANG Hongwei |
Beijing Information Science and Technology University, Beijing , China |
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| Abstract: |
| Objective To study electromagnetic hazards of lightning electromagnetic pulse (LEMP) on portable computers with electromagnetic simulation software XFDTD. Methods The time domain waveform of electric field at sampling point and the sectional view of electric-field distribution inside the cavity were given. The shielding effectiveness and the instantaneous Poynting vector in different positions in the cavity were calculated. The coupling of the lightning electromagnetic pulse with the front aperture array and the side hole of the cavity and the mutual coupling of holes were analyzed. Results The electromagnetic pulse of lightning caused coupling of different degrees to the small holes on the front and sides. Lightning electromagnetic pulse had little electromagnetic harm to inside part of the cavity. The electromagnetic energy was mainly confined to the neighboring of the open hole. The center of the cavity was affected least. The larger the aperture area was; the more electromagnetic energy was coupled. The mutual coupling effect between adjacent holes leaded to poor shielding effectiveness of the cavity. Conclusion Lightning electromagnetic pulses commonly do little harm to portable computers. |
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