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| Computing Method of Environment Equivalent Temperature Based on Arrhenius Equation for Missile Products |
| Received:March 16, 2018 Revised:June 25, 2018 |
| View Full Text View/Add Comment Download reader |
| DOI：10.7643/ issn.1672-9242.2018.06.014 |
| KeyWord:missile accelerated storage life test equivalent temperature arrhenius equation |
| Author | Institution |
| ZHANG Shi-nian |
Division 24, 109 of Beiqinglu road, Town of Xibeiwang, Haidian District, Beijing, |
| YAN Shi-yuan |
Division 24, 109 of Beiqinglu road, Town of Xibeiwang, Haidian District, Beijing, |
| ZHANG Guo-bin |
Division 24, 109 of Beiqinglu road, Town of Xibeiwang, Haidian District, Beijing, |
| WU Xun |
Division 24, 109 of Beiqinglu road, Town of Xibeiwang, Haidian District, Beijing, |
| LIU-Chun-he |
Division 24, 109 of Beiqinglu road, Town of Xibeiwang, Haidian District, Beijing, |
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| Abstract: |
| Objective To discuss the method of calculating the nominal stress level, which is also called environmental equivalent temperature, for computing accelerated factor used in the missile products’ accelerated storage life tests based on the Arrhenius equation. Methods The equivalent temperature equation was derived, based on the hypothesis that the accelerated storage life test time under the equivalent temperature was equal to the sum of the test time under the Arrhenius equation’s, where the storage temperature was sourced from the missile weapons’ spot observation. The computation result was compared based on these data. Results According to the theoretic analysis as well as the calculation example, the environmental equivalent temperature was not only related to the missile weapons’ storage temperature and its distribution, but is also influenced by the activation energy of the test object, which had great effect on the accelerated storage life tests. Conclusion Both the missile weapons’ environment temperature profile in storage or usage and the activation energy of the test object should be taken into account when calculating the nominal stress level for the missile products’ accelerated storage life test. |
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