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| Design of Accelerated Life Test for Automotive Electronics Based on Arrhenius Model |
| Received:December 22, 2018 Revised:March 25, 2019 |
| View Full Text View/Add Comment Download reader |
| DOI：10.7643/ issn.1672-9242.2019.03.005 |
| KeyWord:Arrhenius model automotive electrons accelerated life test |
| Author | Institution |
| WANG Yu-peng |
Weichai Power Co., Ltd, Weifang , China |
| GAO Xin |
Weichai Power Co., Ltd, Weifang , China |
| CHEN Wen-miao |
Weichai Power Co., Ltd, Weifang , China |
| WANG Tao |
Weichai Power Co., Ltd, Weifang , China |
| SONG Xing-xin |
Weichai Power Co., Ltd, Weifang , China |
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| Abstract: |
| Objective To analyze the basic equations of the Arrhenius model and provide experimental design methods for evaluating the thermal stress level of products. Methods The acceleration factor and the accelerated life test time of several temperature points in the life cycle were derived, and the relationship between the equivalent temperature point and the temperature and time of each point in the life cycle was calculated. Results According to the normal temperature distribution of automotive electronic products, the equivalent temperature point curve was calculated as the input of automotive electronic acceleration life test to demonstrate the difference with the traditional test methods through examples. Conclusion The equivalent temperature point method is more suitable for all kinds of temperature distribution than the traditional method and can evaluate the thermal stress level of products more accurately. |
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