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| A Storage Life Assessment Method of Highly Reliable Electronic Product |
| Received:October 07, 2018 Revised:March 25, 2019 |
| View Full Text View/Add Comment Download reader |
| DOI：10.7643/ issn.1672-9242.2019.03.006 |
| KeyWord:multi-stress accelerated test storage life assessment |
| Author | Institution |
| WANG Jiu-xing |
1. Beijing Institute of Control and Electronics Technology, Beijing , China |
| FU Li-li |
1. Beijing Institute of Control and Electronics Technology, Beijing , China |
| XING Zhi-wei |
1. Beijing Institute of Control and Electronics Technology, Beijing , China |
| LIU Xiong-fei |
2. Launch Vehicle Technology Academy of China Aerospace Science & Technology Industry Corporation, Beijing , China |
| WANG Rui |
2. Launch Vehicle Technology Academy of China Aerospace Science & Technology Industry Corporation, Beijing , China |
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| Abstract: |
| This paper proposed a method of the storage life assessment for high reliability electronic product based on the accelerated test with multiple accelerating stresses. First, the technological process of the storage life assessment for electronic products based on the accelerated test with multiple accelerating stresses was introduced; then it was pointed that the key was to choose accelerating stresses and accelerated model according to characteristics of product. This assessment method is verified through practice. It could rapidly assess the storage life of highly reliable product. |
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