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| Highly Accelerated Life Test Applied to Optical Fiber Acousto-optic Modulator |
| Received:August 31, 2019 Revised:September 25, 2019 |
| View Full Text View/Add Comment Download reader |
| DOI：10.7643/issn.1672-9242.2020.03.013 |
| KeyWord:highly accelerated life test failure mode reliability |
| Author | Institution |
| LI Zhe |
CEPREI, Chongqing , China |
| MENG Li |
CEPREI, Chongqing , China |
| XU Guang-ning |
The Fifth Electronics Research Institute of MIIT, Guangzhou , China |
| YUAN Guang-hua |
The Fifth Electronics Research Institute of MIIT, Guangzhou , China |
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| Abstract: |
| The paper aims to stimulate the product defect of the fiber-optic and acousto-optic modulator into a fault that can be detected to find the failure mode, to provide a basis for establishing the failure mechanism library and improving the reliability of the product. The method of high accelerated life test was adopted in combination with the analysis results of sensitive stress, to design the testing program, conduct the test, quickly excite the design and industrial defects inside the product, to turn it to a detectable fault, so as to perform failure analysis on the failing product, and finally find the failure mode. The test provoked five faults, then isolated the faults, and selected five failing products for failure analysis:the tested object 6# showed no abnormality, 8#, 12#, 15# were invalid resulted from the mechanical cracking of the internal electro-acoustic transducer. 11#:the internal pin of the crystal oscillator was subjected to stress during the vibration process, resulting in no output of the crystal oscillator. Two types of failure modes are counted, one is the mechanical cracking of electro-acoustic transducers, and the other is the cracking of the internal pins of the crystal oscillator caused by stress during the vibration process. It provides a basis for further analyzing the failure mechanism, establishing the failure mechanism library and performing corresponding reliability improvement and process optimization in combination with the failure mechanism. |
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