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| Study on Accelerated Storage Life Testing of Infrared Sensor Component of Smart Ammunition |
| Received:May 06, 2012 Revised:August 15, 2012 |
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| DOI： |
| KeyWord:accelerated life testing infrared sensor accelerated stress storage life |
| Author | Institution |
| HAO Chong |
Ordnance Engineering College， Shijiazhuang ， China |
| XU Lu-tie |
Ordnance Engineering College， Shijiazhuang ， China |
| YU Wei-bo |
Ordnance Engineering College， Shijiazhuang ， China |
| FAN Wen-jun |
Jinxi Industries Group Co. LTD.， Taiyuan ， China |
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| Abstract: |
| It is difficult to verify the reliability of a new type of ammunition components through traditional statistical testing methods. The model-based accelerated life test method limited by acceleration model, is applicable only to component and material level at present. Based on accelerated life test theories and methods, the structural characteristics of smart ammunition infrared sensor components were determined, and the hierarchical storage failure analysis were carried out one by one on each component. The main types of storage environment stress leading to component failure were summed up, and the point of view of applying step accelerated life test program was put forward. |
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