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| Combined Environmental Test of Key Electronic Equipments of Manned Spacecraft |
| Received:June 03, 2012 Revised:October 15, 2012 |
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| DOI： |
| KeyWord:manned spacecraft key electronic equipments combined environmental test |
| Author | Institution |
| LEI Jian-yu |
China Academy of Space Technology， Institute of Manned Spacecraft System Engineering， Beijing ， China |
| HUO Jia-jing |
China Academy of Space Technology， Institute of Manned Spacecraft System Engineering， Beijing ， China |
| CHU Li-yan |
China Academy of Space Technology， Institute of Manned Spacecraft System Engineering， Beijing ， China |
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| Abstract: |
| Electronic equipments of manned spacecraft subject to various environmental stress on orbit. To strength the reliability of key electronic equipment of manned spacecraft, a scheme of combined environmental test was established and test procedure was designed, which determined the environmental conditions of every single item. 136 units of key electronic equipments for 9 manned spacecrafts were selected to participate in the combined environmental tests. The results showed that combined environmental test can effectively expose defects of manned spacecraft electronic equipments design and manufacturing. |
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