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| Study on Single Stress Level Accelerated Life Test of Guided Ammunition Initiating Device |
| Received:April 12, 2012 Revised:October 15, 2012 |
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| DOI： |
| KeyWord:single stress level long-term storage guided ammunition accelerated life test initiating device |
| Author | Institution |
| LIU Chao-yang |
Ordnance Engineering College，Shijiazhuang ，China |
| ZHAO Xiao-li |
Ordnance Engineering College，Shijiazhuang ，China |
| YANG Yan-feng |
Ordnance Engineering College，Shijiazhuang ，China |
| CUI Liang |
Ordnance Engineering College，Shijiazhuang ，China |
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| Abstract: |
| Estimating the residual life of initiating device exactly is very important for guided ammunition servicing. The necessity of accelerated life test of initiating device was introduced from the storage reality of guided ammunition. Accelerated stress, life distribution, accelerated coefficient, stress level and test time in accelerated life test of initiating device were analyzed. Considering the single stress level characteristic of long-term storage test of initiating device, the data treatment method was discussed from different aspects, so as to get more accurate result. |
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