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| On Accelerated Life Test Method of High-power Infrared Sensor |
| Received:July 27, 2012 Revised:December 15, 2012 |
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| DOI： |
| KeyWord:accelerated life test (ALT) infrared sensor assess |
| Author | Institution |
| XUAN Zhao-long |
Ordnance Engineering College，Shijiazhuang ，China |
| CHENG Ze |
Ordnance Engineering College，Shijiazhuang ，China |
| LIU Ya-chao |
Ordnance Engineering College，Shijiazhuang ，China |
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| Abstract: |
| The thermal target under complex background environment can be detected effectively by infrared detection technology. In order to acquire the life information of infrared sensor, accelerated life test (ALT) was conducted with increased temperature stress. Weibull distribution function was applied to study some key technologies of ALT of infrared sensor. The procedure of the accelerated life test was put forward. |
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