The Military Representative Office of Engineer Military Representative Bureau in Xi’an and Lanzhou，Xi’an，China
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Abstract:
Based on the factory test data, the samples of electronic component high temperature storage test were determined based on Bayes, which are less than the samples defined by GJB345A-2005. The lifetime distribution of electronic component and the Bayes estimation of failure probability were obtained by structuring lifetime model and determining prior distribution based on the different test results.