Application Research of GJB150A in Low Temperature Test of Some Communication Equipment
Received:February 26, 2013  Revised:July 01, 2013
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DOI:10.7643/issn.1672-9242.2013.04.012
KeyWord:GJB150A  low temperature test  environment profile
     
AuthorInstitution
WENG Lei Jiangnan Institute of Computing Technology,Wuxi,China
LIU Yan Jiangnan Institute of Computing Technology,Wuxi,China
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Abstract:
      Many users are not used to GJB150A after issued for such long time for its tailor standard character, which cause a lot of puzzles for test work. Low temperature test outlines of some communication equipment using GJB150A were discussed according to the life-span profile and environment profile of equipment. The selection bases and results of test procedure, test sequence, and test condition were analyzed. The requirements on test facility and specimen were put forward. The purpose was to provide guidance for users of GJB150A to get rid of constraint of menu type test standards.
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