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Application Research of GJB150A in Low Temperature Test of Some Communication Equipment |
Received:February 26, 2013 Revised:July 01, 2013 |
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DOI:10.7643/issn.1672-9242.2013.04.012 |
KeyWord:GJB150A low temperature test environment profile |
Author | Institution |
WENG Lei |
Jiangnan Institute of Computing Technology,Wuxi,China |
LIU Yan |
Jiangnan Institute of Computing Technology,Wuxi,China |
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Abstract: |
Many users are not used to GJB150A after issued for such long time for its tailor standard character, which cause a lot of puzzles for test work. Low temperature test outlines of some communication equipment using GJB150A were discussed according to the life-span profile and environment profile of equipment. The selection bases and results of test procedure, test sequence, and test condition were analyzed. The requirements on test facility and specimen were put forward. The purpose was to provide guidance for users of GJB150A to get rid of constraint of menu type test standards. |
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