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| A Method for the Reliability Prediction of Electronic Components in Guided Munitions |
| Received:November 01, 2013 Revised:December 21, 2013 |
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| DOI：10.7643/issn.1672-9242.2014.02.020 |
| KeyWord:guided munitions ammunition reliability electronic reliability reliability prediction |
| Author | Institution |
| ZHONG Wei-jun |
Department of Ammunition Engineering，Ordnance Engineering College，Shijiazhuang，China |
| LI De-sheng |
Department of Ammunition Engineering，Ordnance Engineering College，Shijiazhuang，China |
| CUI Liang |
Department of Ammunition Engineering，Ordnance Engineering College，Shijiazhuang，China |
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| Abstract: |
| ObjectiveThe intension and time during the whole life were both considered to predict and the reliability of the electronic components in the guided munitions. MethodsA method for the reliability prediction of common electronic equipment was introduced into the guided munitions. For transportation and storage environment，the nonoperating method was adopted. For the firing environment，the operating method was adopted.ResultsAfter storage for 10~15years, the reliability was between0.895and0.91. ConclusionConsidering the prediction results for all electronic components，the electronic components can satisfy the employment after storage for10~15years. |
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