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| Analysis Method of Performance Degradation of Electronic Product Based on Function Simulation |
| Received:May 30, 2014 Revised:July 02, 2014 |
| View Full Text View/Add Comment Download reader |
| DOI：10. 7643 /issn. 1672-9242. 2014. 05. 009 |
| KeyWord:electronic product performance degradation simulation analysis accelerated degradation test |
| Author | Institution |
| ZHANG Hui |
China Aero-Polytechnology Establishment, Beijing , China |
| WANG Tao |
China Aero-Polytechnology Establishment, Beijing , China |
| LI Ming |
China Aero-Polytechnology Establishment, Beijing , China |
| ZENG Chen-hui |
China Aero-Polytechnology Establishment, Beijing , China |
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| Abstract: |
| Objective To study the analysis method of performance degradation during long-term operation based on function simulation. Methods Accelerated degradation test was directly carried out on the power supply module, and the test data was used for reliability analysis. At the same time, accelerated degradation test was carried out on the key components of performance degradation in power supply circuit. The test data was injected into the function simulation model of power supply to simulate performance degradation and analyze the reliability. Finally, the results of the two kinds of analyses were compared to demonstrate the effectiveness of the proposed simulation method. Results Comparison showed that average life span of power supply was 281 560 hours based on the accelerated degradation test while 357 290 hours based on the degradation simulation analysis. Conclusion The result of the simulation method was too optimistic, since it only considered the performance degradation of the key components. But the deviation was within a reasonable range, which proved that the method was effective, and the application of this method could assist design improvement and iterative analysis. |
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