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| Research on the Software and Hardware Architecture Design Technique for Ultrahigh-speed Transient Testing System |
| Received:December 30, 2014 Revised:April 15, 2015 |
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| DOI：10.7643/issn.1672-9242.2015.02.017 |
| KeyWord:ultrahigh-speed transient testing system PXI Express bus RAID array stream disk finite state machine |
| Author | Institution |
| ZHANG Rong |
Institute of Systems Engineering, CAEP，Mianyang ，China |
| CHEN Ying |
Institute of Systems Engineering, CAEP，Mianyang ，China |
| HUANG Hai-ying |
Institute of Systems Engineering, CAEP，Mianyang ，China |
| WANG Song |
Institute of Systems Engineering, CAEP，Mianyang ，China |
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| Abstract: |
| Objective The design technique for 64 channels ultrahigh-speed synchronous transient testing system with data sampling frequency of 2 MHz-10 MHz was researched, in order to realize the design of hardware architecture and software architecture for two kinds of typical ultrahigh-speed transient testing systems. Methods For hardware architecture, the continuous high-speed test system with continuous flow disk storage constructed based on PXI-Express bus data transmission and RAID array stream disk data saving and the high-speed test system constructed based on large capacity on-board cache data saving and bus downloading transmission were applied in detail. For high-performance system software design, the design technique with application of producer/consumer architecture and finite state machine was applied. Results Currently, for system with 64 channels, the data sampling frequency could only reach 2.5 MHz with the limitation of file writing speed based on PXI Express bus and raid array stream disk data saving architecture, while the data sampling frequency could reach 10 MHz based on architecture with on-board cache data and PXI bus downloading data, in this condition, the test time of the system could reach 5 s. Conclusion These two kinds of test systems could both meet the requirements of ultrahigh-speed transient test, and the system architecture could be decided by the maximum sampling frequency required. |
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