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| Research On Failure Mechanism Consistency of Accelerated Testfor Temperature Stress Based on POF |
| Received:March 09, 2016 Revised:November 22, 2016 |
| View Full Text View/Add Comment Download reader |
| DOI：10.7643/ issn.1672-9242.2016.06.018 |
| KeyWord:accellerated life test temperatue POF failure mechanism consistency |
| Author | Institution |
| 郑志腾 |
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| 董澍 |
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| 徐丹君 |
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| 蔡健平 |
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| 伍招冲 |
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| Abstract: |
| Objective To save test sample and provide guarantee for the efficiency of accelerated test by obtaining the change point for accelerated life test based on POF. Methods By analyzing failure mechanism consistency model and calculating the activation energy of MOSFET, the change point was obtained. And failure physical analysis was implemented to verify the correctness and applicability of the theory from micro perspective. Results When temperature is at below 240℃, the failure mechanism hasn’t changed. And when the temperature is higher than 240℃，the failure mechanism has changed. Conclusion The study showed that POF method can confirm the change point for temperature stress and the required sample size is small. |
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