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| ADT Model under the Stress of Natural Random Temperature |
| Received:March 24, 2017 Revised:July 15, 2017 |
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| DOI：10.7643/ issn.1672-9242.2017.07.020 |
| KeyWord:service life accelerated degradation factor pseudo life distribution |
| Author | Institution |
| WANG Yan-lin |
Beijing Institute of Electronic System Engineering, Beijing , China |
| YAO Hong-wei |
Beijing Institute of Electronic System Engineering, Beijing , China |
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| Abstract: |
| Objective To analyze and evaluate the service time of maintenance-free missiles with the accelerated degradation experiment, give equivalent treatment method for stress of natural random temperature, and build a model of the accelerated degradation factors. Methods The statistical processing method was applied to treat environment temperature data. The Arrhenius model was adopted to draw the conclusion about the mean function of equivalent temperature in time domain. The random temperature was converted into the cycling stress of temperature. The accelerated degradation model based on statistics was applied to obtain the activation energy of product and deduce the mathematic model of accelerated degradation corresponding to the stress of natural random temperature. Results The service life of a product in a typical region was given with the accelerated. The result of evaluation was in line with the expectation. Conclusion The improved accelerated degradation model takes into consideration the impact of the random temperature in natural environment on the use of the product, thus it can better evaluate the service life of product. |
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