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| Storage Performance Degradation of Typical Capacitance Proximity Fuse |
| Received:October 02, 2017 Revised:February 15, 2018 |
| View Full Text View/Add Comment Download reader |
| DOI：10.7643/ issn.1672-9242.2018.02.012 |
| KeyWord:capacitance proximity fuse storage performance degradation analysis |
| Author | Institution |
| WU Ying-wei |
1.Shijiazhuang Campus, Army Engineering University, Shijiazhuang , China; 2.Baicheng Ordnance Test Center of China, Baicheng , China |
| QI Xing-lin |
Shijiazhuang Campus, Army Engineering University, Shijiazhuang , China |
| WANG Hong-yan |
Shijiazhuang Campus, Army Engineering University, Shijiazhuang , China |
| YU Chun-hua |
Military Delegate Office of Beijing Military Delegate Bureau to Changzhi, PLA Army, Changzhi , China |
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| Abstract: |
| Objective To analyze causes and mechanisms of degradation or failure. Methods The storage performance test method of capacitance proximity fuse was put forward. In combination with the requirements of the composition, structure and performance of fuse, storage performance of fuse stored for 2~8 years was tested. And the test results were analyzed to determine the sensitive parameters of the performance degradation. Results Performance degradation of the causes and mechanism analysis shown that the transistor, the resistance, the conductive adhesive force in the circuit, the inductance coil and other long storage performance degradation influenced the fuse performance. Conclusion After determination of test after long storage of fuse, it is important to pay attention to the three parameters of input current, explosion height and detection voltage, and focus on the analysis of the transistor, the resistance, the conductive glue and the inductance coil in the circuit. |
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