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| Method for Determining Cycling Number for Thermal Cycling Tests of Different Spacecraft Electronics |
| Received:October 12, 2018 Revised:November 25, 2018 |
| View Full Text View/Add Comment Download reader |
| DOI：10.7643/ issn.1672-9242.2018.11.001 |
| KeyWord:thermal cycling test thermal fatigue test condition |
| Author | Institution |
| JI Xin-yan |
1. Beihang University, Beijing , China;2. Beijing Institute of Spacecraft Environment Engineering, Beijing , China |
| XIANG Shu-hong |
2. Beijing Institute of Spacecraft Environment Engineering, Beijing , China |
| LIU Guo-qing |
2. Beijing Institute of Spacecraft Environment Engineering, Beijing , China |
| WANG Jing |
2. Beijing Institute of Spacecraft Environment Engineering, Beijing , China |
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| Abstract: |
| Objective To provide proper conditions for thermal cycling test at ordinary temperature of different spacecraft electronic devices to obtain equal stress screening for spacecraft electronic devices under different cycling numbers and temper-atures ranges and propose a customized method for determining the cycling number. Methods Based on the thermal fatigue theory, the typically failure thermal-mechanism were analyzed, and the integrated fatigue acceleration exponent and failure precipitation efficiency were introduced to establish an equivalent fatigue life equation of spacecraft cycling testing, which covers the characteristics of design, material and workmanship, and the history failures data statistics of spacecrafts. The tailored testing condition of typical electronic equipment was given as an example to provide the test condition determined by this method. Results This method can reduce the spacecraft risk of under-testing and over-testing. |
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