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| Performance Degeneration Modeling and Life Prediction of Electronic Measuring Equipment Based on Wiener Process |
| Received:July 11, 2018 Revised:March 25, 2019 |
| View Full Text View/Add Comment Download reader |
| DOI：10.7643/ issn.1672-9242.2019.03.014 |
| KeyWord:Wiener process electronic measuring equipment degeneration life prediction. |
| Author | Institution |
| TAN Yong |
1. Southwest Research Institute of Technology and Engineering, Chongqing , China; 2. Natural Environmental Test and Research Center of Science, Technology and Industry for National Defense, Chongqing , China |
| ZHANG Zi-juan |
1. Southwest Research Institute of Technology and Engineering, Chongqing , China |
| HUANG Ting-ting |
3. Beihang University, Beijing , China |
| ZHU Yu-qin |
1. Southwest Research Institute of Technology and Engineering, Chongqing , China; 2. Natural Environmental Test and Research Center of Science, Technology and Industry for National Defense, Chongqing , China |
| ZHOU Kun |
1. Southwest Research Institute of Technology and Engineering, Chongqing , China; 2. Natural Environmental Test and Research Center of Science, Technology and Industry for National Defense, Chongqing , China |
| ZHANG Kai |
1. Southwest Research Institute of Technology and Engineering, Chongqing , China; 2. Natural Environmental Test and Research Center of Science, Technology and Industry for National Defense, Chongqing , China |
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| Abstract: |
| Objective To predict the life of electronic measuring equipment, evaluate its health state, improve the accuracy of equipment condition monitoring and give full play to the equipment performance. Methods Based on the Wiener process, the performance degradation model and reliability model of the electronic measurement equipment were established, and the model parameters were estimated in combination with the degradation data and the environmental parameters of the electronic measuring equipment. Results With a certain type of electronic measuring equipment as an example, the performance degradation modeling with better fitting was built, and life prediction was carried out. Conclusion This method reduces the test cost of the electronic measuring equipment in the life prediction, improves the practical ability of the life prediction technology, and has certain engineering application value. |
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