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| Research on Accelerated Life Test Method of Spaceborne Passive Microwave Devices |
| Received:April 22, 2021 Revised:May 20, 2021 |
| View Full Text View/Add Comment Download reader |
| DOI：10.7643/issn.1672-9242.2021.10.008 |
| KeyWord:passive microwave device dual stress high reliability and long life accelerated life test generalized Eyring model |
| Author | Institution |
| WEI Yan-jiang |
The 29th Research Institute of China Electronics Technology Group Corporation, Chengdu , China |
| ZHOU Yi |
The 29th Research Institute of China Electronics Technology Group Corporation, Chengdu , China |
| YANG Guang |
The 29th Research Institute of China Electronics Technology Group Corporation, Chengdu , China |
| JIN Xiao-dong |
The 29th Research Institute of China Electronics Technology Group Corporation, Chengdu , China |
| GUAN Zhao-hui |
The 29th Research Institute of China Electronics Technology Group Corporation, Chengdu , China |
| LEI Ming |
The 29th Research Institute of China Electronics Technology Group Corporation, Chengdu , China |
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| Abstract: |
| This paper aims to provide theoretical basis and test method for verifying the reliability and life ofpassive microwave devicesof satellites in orbit through accelerated life test on the ground. A mathematical model of double stress accelerated life was designed under the simultaneous action of temperature and power. By analyzing the corresponding relationship between accelerated stress and life, a scientific and reasonable accelerated life test scheme was designed. By analyzing the changes of device index in accelerated life test, the reliability and life evaluation results are given. Taking a typical passive microwave device-isolator as an example, under the selected activation energy of 0.8 eV, using the temperature-power dual stress accelerated life mathematical model, it is calculated that the accelerated life test time needs to be not less than 1230 h for the isolator to meet the 10 a in-orbit life and reliability. Through accelerated life test for more than 1300 hours, comparing the isolator indexes before and after the test, the forward loss of isolator deteriorates by 0.07 dB, indicating that the accelerated life test has certain influence on the electrical performance aging of products, but the index changes are within the technical requirements, indicating that the products can meet the requirements of reliability and life. The designed temperature-power dual stress accelerated life mathematical model and accelerated life test scheme can provide reference for high reliability and long life verification of spaceborne passive microwave devices. |
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