Influence of Temperature-Humidity-Altitude Environment on the Performance of Aerospace Explosive Devices
Received:October 25, 2021  Revised:January 25, 2022
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DOI:10.7643/issn.1672-9242.2022.02.002
KeyWord:aerospace explosive devices  temperature- humidity-altitude  seal failure  explosive material damp  storage life  seal improvement
              
AuthorInstitution
TANG Ke Beijing Institute of Astronautical Systems Engineering, Beijing , China
WANG Rui-qiong Beijing Institute of Astronautical Systems Engineering, Beijing , China
QU Zhan-long Beijing Institute of Astronautical Systems Engineering, Beijing , China
CHEN Kai Beijing Institute of Astronautical Systems Engineering, Beijing , China
ZHAO Yu-hui Beijing Institute of Astronautical Systems Engineering, Beijing , China
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Abstract:
      The sealing failures in the temperature- humidity-altitude environment has occurred in explosive devices. Therefore, this paper studied the mechanism of temperature-humidity-altitude environment on the sealing performance of aerospace explosive devices. The origin of temperature-humidity-altitude environment was investigated, the differences of test methods in different standards were compared, and the failure causes and mechanisms of two cases of explosive device failure caused by temperature-humidity-altitude environment were analyzed. Due to the process of mutual transformation between low temperature & low pressure and high temperature & high humidity for many times, the condensate water on the surface was “pressed” into the interior of device because of the “negative pressure” characteristic, forming the accumulated water. After multiple cycles, the internal accumulated water became more serious. The fault case shows that the temperature- humidity-altitude environment, which tends to cause the sealing failure of the device, and in turn causes the operational failure. Therefore, it is necessary to take effective sealing measures for aerospace explosive devices and conduct temperature-humidity-height assessment according to the standard requirements to test the sealing performance of the devices and ensure the storage life of the devices.
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