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Correction and Structural State Analysis under Pyrotechnic Shock Signal |
Received:January 10, 2021 Revised:March 03, 2021 |
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DOI:10.7643/issn.1672-9242.2022.04.002 |
KeyWord:pyrotechnic shock trend item wavelet decomposition shock response spectrum correlation coefficient |
Author | Institution |
WANG Peng |
Institute of Systems Engineering, China Academy of Engineering Physics, Sichuan Mianyang , China |
LI Wei |
Institute of Systems Engineering, China Academy of Engineering Physics, Sichuan Mianyang , China |
ZHANG Jun |
Institute of Systems Engineering, China Academy of Engineering Physics, Sichuan Mianyang , China |
WANG Jun-ping |
Institute of Systems Engineering, China Academy of Engineering Physics, Sichuan Mianyang , China |
HUANG Han-jun |
Institute of Systems Engineering, China Academy of Engineering Physics, Sichuan Mianyang , China |
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Abstract: |
This paper is to analyze the status change of key structure through validity analysis and correction of pyrotechnic shock signal. The zero-shift trend item of an actual pyrotechnic shock signal and its velocity integral are corrected and eliminated based on discrete wavelet decomposition method. The residual free response stage after the shock is selected to analyze the structural state. Based on the initial spectrum of the shock signal and the correlation analysis of the residual spectrum, a method for determining the initial analysis time of the residual free response stage is proposed. The residual response signal is combined with frequency domain window filtering to perform spectral analysis, and the status change of the structure is judged by the change of the natural frequency at the same position in two tests. The zero-shift trend item of a measured signal is effectively eliminated, the critical analyzing time of residual free response stage is determined, and the structural status change is obtained by the spectrum analysis. This analysis can provide a solution idea and method for monitoring and analyzing the key structure state under pyrotechnic shock environment during the complex sequential tests. |
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