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| Acceleration Factor Estimation of Missile-borne Electronic Components |
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| DOI：10.7643/issn.1672-9242.2022.08.002 |
| KeyWord:electronic components accelerated life test acceleration factor Arrhenius model environment temperature equivalent temperature |
| Author | Institution |
| LIU Xiao-di |
Naval Aeronautical University, Shandong Yantai , China |
| HAN Jian-li |
Naval Aeronautical University, Shandong Yantai , China |
| JIANG Pu-tao |
Naval Aeronautical University, Shandong Yantai , China |
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| Abstract: |
| The paper aims to study the acceleration factor estimation method based on equivalent temperature for the high reliability and long life electronic components in the actual storage environment. Firstly, the failure mechanism of electronic equipment on the missile is analyzed. Then based on Arrhenius model, the corresponding relationship between acceleration stress and actual environment temperature is analyzed, and the equivalent temperature is solved to estimate the acceleration factor. And then the method is used to the timing controller circuit board in a missile integrated controller. The results show that compared with the traditional temperature calculation method by weighted average, this method is more accurate in the acceleration factor estimation and the acceleration test time prediction, and the advantages are more obvious with the increase of the fluctuation of actual environment temperature.This method can effectively improve the accuracy of the estimation of acceleration factor and the prediction of acceleration test time, thus providing effective support for the design of accelerated life test scheme of electronic equipment on the missile. It also has a certain reference value for the acceleration factor estimation of other high reliability and long life products. |
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