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Reliability Design and Index Verification of Zero-second Separating Connector |
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DOI:10.7643/issn.1672-9242.2023.01.009 |
KeyWord:zero-second separating connector high reliability reliability design and analysis reliability verification |
Author | Institution |
WANG Feng-jin |
Beijing Institute of Space Launch Technology, Beijing , China |
WANG Ai-wei |
Beijing Institute of Space Launch Technology, Beijing , China |
CAO Hui-na |
Beijing Institute of Space Launch Technology, Beijing , China |
ZHANG Guo-sheng |
Beijing Institute of Space Launch Technology, Beijing , China |
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Abstract: |
The work aims to realize the high reliability of zero-second separating connector. First of all, the reliability design and analysis were carried out systematically in the product design, the design scheme was selected and optimized, and the inherent reliability level of the connector was improved. Then, through analysis, the weak links and reliability characteristic quantity of the connector were determined, and a reliability test scheme was formulated to verify the reliability level of the connector. Finally, through the evaluation of reliability test data, under the specified test conditions, the one-sided confidence lower limit of launch mission reliability of zero-second separating connector met the specified reliability index. By integrating the reliability design and analysis into the connector engineering design process, the realization of the inherent reliability of the connector is effectively ensured in the design stage. The reliability test scheme is reasonable and feasible, which effectively reduces the number of samples and test cost. In short, engineering experience has been accumulated for the reliability design and verification of similar products. |
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