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| A Double Stress Accelerated Reliability Growth Test with Delayed Corrections |
| Received:September 14, 2023 Revised:September 25, 2023 |
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| DOI：10.7643/issn.1672-9242.2023.10.001 |
| KeyWord:double-stress accelerated reliability growth AMSAA model generalized eyring model acceleration coefficient delayed corrections |
| Author | Institution |
| XING Hao |
School of Reliability and Systems Engineering, Beihang University, Beijing, |
| YANG Jun |
School of Reliability and Systems Engineering, Beihang University, Beijing, |
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| Abstract: |
| The work aims to shorten the time of traditional accelerated reliability growth tests and consider the effect of delayed corrections on product reliability. A double-stress accelerated reliability growth test method considering delayed corrections was proposed. Firstly, the reliability growth process was tracked with the AMSAA model based on delayed correction, and the model parameters were estimated by the maximum likelihood estimation method. Secondly, with temperature and vibration as the accelerated stress, an accelerated life test was carried out to obtain the test data, and the acceleration coefficient was obtained by the least square estimation method based on the generalized eyring model. Then, the product reliability was extrapolated to normal stress level. The application case analysis of aircraft storage battery showed that the proposed method could shorten the test time by 29.4% compared with the high-stress accelerated reliability growth test based on single-stress loading and the delayed corrections method had an impact on the product reliability. It provides technical methods for reliability evaluation of high-stress accelerated reliability growth tests under double-stress loading and delayed corrections. |
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