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| Research Progress on Visual Wave Measurement Technology and Intelligent Image Optimization Algorithm |
| Received:October 30, 2024 Revised:December 05, 2024 |
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| DOI：10.7643/issn.1672-9242.2025.01.012 |
| KeyWord:machine vision wave monitoring image recognition feature matching neural network deep learning intelligent algorithm |
| Author | Institution |
| ZHU Zhenhui |
China Ship Scientific Research Center, Jiangsu Wuxi , China |
| WANG Xueliang |
China Ship Scientific Research Center, Jiangsu Wuxi , China;National Key Laboratory of Ship Structural Safety, Jiangsu Wuxi , China |
| SUN Hanyu |
China Ship Scientific Research Center, Jiangsu Wuxi , China;National Key Laboratory of Ship Structural Safety, Jiangsu Wuxi , China |
| YAO Ji |
China Ship Scientific Research Center, Jiangsu Wuxi , China;National Key Laboratory of Ship Structural Safety, Jiangsu Wuxi , China |
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| Abstract: |
| The work aims to provide an overview of vision-based wave measurement technology in wave monitoring, focusing on the basic principles of monocular, binocular, and multiocular vision technologies and analyze their advantages and disadvantages through application case studies. Intelligent algorithms, such as convolutional neural networks and long short-term memory neural networks, are gradually being applied to image processing. The specific applications of artificial intelligence in stages such as corner detection and feature matching in visual wave measurement technology are analyzed. The progress made by deep learning algorithms in wave inversion and wave prediction is discussed. The importance of intelligent algorithms and technologies in optimizing wave monitoring systems is elaborated, and the future development trends of artificial intelligence in this field are prospected. |
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