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| Research Progress on Evaluation Methods for Storage Life of Inertial Devices |
| Received:December 06, 2024 Revised:January 22, 2025 |
| View Full Text View/Add Comment Download reader |
| DOI：10.7643/issn.1672-9242.2025.03.010 |
| KeyWord:inertial device sensor storage life evaluation method accelerated storage natural storage |
| Author | Institution |
| YAO Yanqing |
Beijing Chenjing Electronics Co., Ltd., Beijing , China |
| ZHANG Shunan |
Beijing Chenjing Electronics Co., Ltd., Beijing , China |
| TANG Yi |
Beijing Chenjing Electronics Co., Ltd., Beijing , China |
| LIAO Xingcai |
Beijing Chenjing Electronics Co., Ltd., Beijing , China |
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| Abstract: |
| The characteristics and lifespan distribution of storage data that should be possessed by natural storage test evaluation methods were summarized. The necessity of determining the type and range of accelerated stress by pre-experiment and the common methods of establishing the life distribution model, accelerated life model and performance degradation model of inertial devices was analyzed. Specific experimental schemes such as failure criteria, test time, and test cycle for current storage life evaluation were summarized and discussed. The results indicated that the evaluation of the storage life of inertial sensors was usually carried out through accelerated storage testing, which usually followed a Weibull distribution. When using temperature as the acceleration stress, the Arrhenius model was usually used as the acceleration model. When conducting experiments, the stepwise temperature stress and timed truncation method were usually used, which had certain reference significance for conducting storage life tests of inertial devices. |
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